Univ.-Prof. Dr. Paola Ayala

Berta-Karlik-Professur (befristet auf drei Jahre) an der Fakultät für Physik

Curriculum Vitae:

born 1977 in Quito, Ecuador
2003 Laurea in Physics at Escuela Politécnica Nacional, Quito-Ecuador
2001 Visiting Researcher, Stevens Institute of Technology New Jersey, USA
2002 Visiting Researcher, Pontificia Universidad Católica  do Rio de Janeiro, Brasil
2005 Visiting Researcher, Instituto Potosino de Ciencia y Tecnología, IPICyT, Mexico
2006 Visiting Researcher, IFW-Dresden (DAAD Grant holder), Germany
2003-2007 Grant holder, National Council for Scientific and Technological Development, Brazil
2007 PhD in Physics, Pontificia Universidad Católica do Rio de Janeiro
2007-2009 Postdoctoral Researcher Helsinki University of Technology, Finland
2008-2009 Assistant Manager of EU projects BNC-Tubes FP6 NMP and IMPART – FP6, Finland
2009-2010 Universitätsassistentin, Faculty of Physics, University of Vienna
2011-2013 Marie Curie Fellow of the EU (IEF-FP7) at the University of Vienna
2012 Prometeo Fellow (Research grant, SENESCyT-Ecuador, Declined)
2012 Science and Technology Forum of the Japan Society for the Promotion of Science and Technology, Future Leaders Representative (Award by the New York Academy of Sciences)
since 2005 Serves as Team leader for Ecuador at the Working group on Women in Physics of the international Union of Pure and Applied Physics (IUPAP)
since 2011 Regional Assistant Editor for Europe for the Journal "Materials Express"
since October 2013 Berta-Karlik-Professorship, Electronic Properties of Materials, University of Vienna

Research Areas:

* Solid State Physics
* Functionalized molecular nanostructures applied in nano- devices
* Spectroscopy (S.) Techniques: X-ray photoelectron S., Ultraviolet photoemission S., E-Energy Loss S., Raman S., Optical S., Infrared S., X-ray absorption S;
* Analytic and imaging characterization: Transmission electron microscopy, Analytical Electron Microscopy, Scanning Electron Microscopy(E-beam and electron lithography), Fluorescence Microscopy, Atomic Force Microscopy;